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The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
Published by: Springer
Publication Date: 2013-11-20
Format: Paperback
ISBN-13: 9783662156148
DOI: 10.1007/BFb0109548
Dimensions: 235cm x155cm
Pages: 220