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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
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Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
R.F. Egerton
Technology & Engineering / Materials Science / General
Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy.
Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.
| Publication Date: | 30 May 2018 |
| Publisher: | Springer International Publishing |
| Imprint: | Springer |
| ISBN-13: | 9783319819860 |
| Format: | Paperback softback |
| Page Count: | 196 |