How to apply XPS and related techniques??with real-world case studies

X-ray photoelectron spectroscopy has become the most heavily used technique for characterizing the composition and chemistry of solid surfaces. X-ray Photoelectron Spectroscopy: An Introduction to Principles and Practices, Second Edition, delivers thoroughly revised coverage (along with two new chapters) reflecting significant advances since the first edition. Paul van der Heide, with decades of hands-on experience in surface analysis, guides readers from foundational concepts to practical applications.

This starts with a prelude on the discovery of photoelectron emission to the impact of surface science. Hardware from both a components and system level are then introduced with a short foray into related techniques (such as HAXPES and NAP-XPS) along with what relates and differentiates XPS and PES. Topics included range from sample handling, methodology development, instrument operation, automation, quantification to data interpretation. This is tied up with a selection of lab, fab and synchrotron based case studies.

Students through to practitioners in the areas of chemistry, physics, and/or material science will find this an authoritative resource for understanding and applying XPS and related techniques.

Paul van der Heide, PhD, is the Director of the Materials and Component Analysis department at imec, based in Leuven, Belgium. ?Previously affiliated with GlobalFoundries, Samsung, and the University of Houston, he has authored or co-authored over 200 publications and is the author of two books on surface analysis techniques.