Indian Institute of Metals Series

Sastry, Gunturi Venkata Sitarama

This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.

Details

Published by: Springer

Publication Date: 2023-09-17

Format: Paperback

ISBN-13: 9789811935114

DOI: 10.1007/978-981-19-3509-1

Dimensions: 235cm x155cm

Pages: 242