{"product_id":"9789811931314","title":"Thermal Reliability of Power Semiconductor Device in the Renewable Energy System","description":"\u003ch1\u003eThermal Reliability of Power Semiconductor Device in the Renewable Energy System\u003c\/h1\u003e \u003ch2\u003eDu, Xiong; Zhang, Jun; Li, Gaoxian; Yu, Yaoyi; Qian, Cheng; Du, Rui\u003c\/h2\u003e \u003cp\u003eThis book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. \u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2022-07-09\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9789811931314\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-981-19-3132-1\u003c\/p\u003e \u003cp\u003eDimensions: 235.0cm x155.0cm\u003c\/p\u003e \u003cp\u003ePages: 172.0\u003c\/p\u003e ","brand":"Springer Nature Singapore","offers":[{"title":"Default Title","offer_id":44808038875276,"sku":"9789811931314","price":152.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9789811931314_4bb8a39c-ce57-4e6a-b3ae-37e2c8608ba3.jpg?v=1763613947","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9789811931314","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}