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KAIST Research Series

KAIST Research Series

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KAIST Research Series

Song, Ji-Ho; Kim, Chung-Youb

This book demonstrates fatigue crack growth under random loading graphically. This state-of-the-art monograph introduces an expert system for crack growth predictions, particularly based on crack closure. The system is developed after years of research by the authors by using the Math-type software consisting of 5 parts. This system is unique as it is fundamentally different from previous systems as it focuses on fatigue crack growth predictions based on fatigue crack closure. This book can be a useful guide for practicing engineers, researchers, and students in the fields of mechanical, aerospace, or civil engineering.

Details

Published by: Springer

Publication Date: 2023-03-06

Format: Paperback

ISBN-13: 9789811680380

DOI: 10.1007/978-981-16-8036-6

Dimensions: 235cm x155cm

Pages: 84

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