Communications in Computer and Information Science: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

Kaushik, Brajesh Kumar; Dasgupta, Sudeb; Singh, Virendra

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Details

Published by: Springer

Publication Date: 2017-12-22

Format: Paperback

ISBN-13: 9789811074691

DOI: 10.1007/978-981-10-7470-7

Dimensions: 235cm x155cm

Pages: 815