{"product_id":"9789811044328","title":"SpringerBriefs in Applied Sciences and Technology: New Perspectives for Materials Characterization","description":"\u003ch1\u003eSpringerBriefs in Applied Sciences and Technology: New Perspectives for Materials Characterization\u003c\/h1\u003e \u003ch2\u003eBrodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald\u003c\/h2\u003e \u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes\/scanning- transmission electron microscopes (SEM\/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM\/-TEM) historically run at higher beam accelerating voltage\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2017-10-06\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9789811044328\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-981-10-4433-5\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 137\u003c\/p\u003e ","brand":"Springer Nature Singapore","offers":[{"title":"Default Title","offer_id":47397881118860,"sku":"9789811044328","price":71.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9789811044328.jpg?v=1775775647","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9789811044328","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}