{"product_id":"9789400730946","title":"Lecture Notes in Electrical Engineering","description":"\u003ch1\u003eLecture Notes in Electrical Engineering\u003c\/h1\u003e \u003ch2\u003eHong, Dongwoo; Cheng, Kwang-Ting\u003c\/h2\u003e \u003cp\u003e\u003c\/p\u003e\u003cp\u003eEfficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2012-03-01\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9789400730946\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-90-481-3443-4\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 98\u003c\/p\u003e ","brand":"Springer Netherlands","offers":[{"title":"Default Title","offer_id":46541761577100,"sku":"9789400730946","price":170.1,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9789400730946.jpg?v=1772830766","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9789400730946","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}