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Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
Published by: Springer
Publication Date: 2012-03-01
Format: Paperback
ISBN-13: 9789400730946
DOI: 10.1007/978-90-481-3443-4
Dimensions: 235cm x155cm
Pages: 98