Lecture Notes in Electrical Engineering

Krishnaswamy, Smita; Markov, Igor L.; Hayes, John P.

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Details

Published by: Springer

Publication Date: 2012-09-21

Format: Hardcover

ISBN-13: 9789048196432

DOI: 10.1007/978-90-481-9644-9

Dimensions: 235cm x155cm

Pages: 124