Test Pattern Generation using Boolean Proof Engines

Drechsler, Rolf; Eggersglüß, Stephan; Fey, Görschwin; Tille, Daniel

In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.

Details

Published by: Springer

Publication Date: 2010-10-19

Format: Paperback

ISBN-13: 9789048184910

DOI: 10.1007/978-90-481-2360-5

Dimensions: 235cm x155cm

Pages: 192