NanoScience and Technology: Atomic Force Microscopy and Scanning Tunneling Microscopy

Voigtländer, Bert

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Details

Published by: Springer

Publication Date: 2015-03-23

Format: Hardcover

ISBN-13: 9783662452394

DOI: 10.1007/978-3-662-45240-0

Dimensions: 235cm x155cm

Pages: 382