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New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

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Springer Series in Surface Sciences

New Horizons of Applied Scanning Electron Microscopy

Kenichi Shimizu | Tomoaki Mitani

Technology & Engineering / Materials Science / Thin Films, Surfaces & Interfaces

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.


Publication Date: 04 May 2012
Publisher: Springer Berlin Heidelberg
Imprint: Springer
ISBN-13: 9783642261688
Format: Paperback softback
Page Count: 182

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