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Anomalous X-Ray Scattering for Materials Characterization Atomic-Scale Structure Determination
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Springer Tracts in Modern Physics
Anomalous X-Ray Scattering for Materials Characterization
Atomic-Scale Structure Determination
Yoshio Waseda
Technology & Engineering / Materials Science / Thin Films, Surfaces & Interfaces
A new materials characterization methods, anomalous X-ray scattering, is presented in this book.
| Publication Date: | 11 September 2002 |
| Publisher: | Springer Berlin Heidelberg |
| Imprint: | Springer |
| ISBN-13: | 9783540434436 |
| Format: | Hardback |
| Page Count: | 214 |