Dieses Buch ist eine aktualisierte Einführung in die Anwendung der spektrometrischen Ellipsometrie mit ihrem praktischen Einsatz bei der Untersuchung von Grenzflächeneigenschaften, Elektronenstrukturen und Quasiteilcheneigenschaften verschiedener Klassen von Dünnschichtmaterialien.

Andrew T.S. Wee, DPhil, is Professor of Physics and Director of the Surface Science Laboratory at the National University of Singapore (NUS). His research is focused on surface and nanoscale science, scanning tunnelling microscopy, and synchrotron radiation studies of the molecule-substrate interface.

Xinmao Yin, PhD, is Professor of Physics at the Shanghai University, China. His research is focused on quantum materials and broad energy range optical spectroscopic techniques.

Chi Sin Tang is scientist at the Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), Singapore. His research is focused on the electronic and optical properties of low-dimensional materials.