This book describes the experimental technique of atomic force microscopy on the atomic scale, also discussing force spectroscopy and the utilization of the probe tip to perform atomic manipulation. It explains the experimental background as well as the theory underlying theory, discussing the various origins of forces and the experimental challenges of measuring these. Experimental noise is addressed, as are strategies to minimize noise and maximize signal-to-noise ratio.

The book also discusses key historical experiments and introduces some of the pioneers behind them, revealing the strategies used by the founding fathers of nanoscience when venturing into this new territory.

Franz J. Giessibl was born in 1962. He has been gathering laboratory experience in laser optics since 1978, obtaining a Diploma at TU Munich in semiconductor physics in 1987. From 1988-1991 he undertook PhD studies with Nobel laureate Gerd Binnig on atomic force microscopy (AFM), and in 1992 was a postdoc with Binnig's group at IBM. From 1992-1994 he worked for a silicon valley startup company that builds AFMs and was involved in achieving the first atomic-resolution AFM results for silicon, which launched the field of noncontact AFM. Giessibl became a strategic management consultant with McKinsey from 1995-1996, during which time he invented and patented the qPlus sensor in his spare time. From 1997-2005 he undertook the habilitation at U. Augsburg, subsequently being offered chairs at Bristol and Regensburg. In 2006 he became professor in Regensburg. Franz J. Giessibl's previous works include: Contributed chapters to Springer books Nanotechnology (Bushan), Noncontact AFM Vol I (2002), Coedited books Noncontact AFM Vol II (2009) and Vol III (2015) with Morita, Meyer, Wiesendanger. He has also published the book "First View inside an Atom - Encounters with Gerhard Richter between Art and Science" Walther König Verlag Cologne (2022).