Fundamentals of Electromigration-Aware Integrated Circuit Design

Lienig, Jens; Rothe, Susann; Thiele, Matthias

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.

Details

Published by: Springer

Publication Date: 2025-02-26

Format: Hardcover

ISBN-13: 9783031800221

DOI: 10.1007/978-3-031-80023-8

Dimensions: 235cm x155cm

Pages: 167