{"product_id":"9783030374990","title":"Noise in Nanoscale Semiconductor Devices","description":"\u003ch1\u003eNoise in Nanoscale Semiconductor Devices\u003c\/h1\u003e \u003ch2\u003eGrasser, Tibor\u003c\/h2\u003e \u003cp\u003e\u003c\/p\u003e\u003cp\u003eThis book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices.  Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models.  Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects.\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eDescribes the state-of-the-art, regarding noise in nanometer semiconductor devices;\u003c\/li\u003e\n\u003cli\u003eEnables readers to design more reliable semiconductor devices;\u003c\/li\u003e\n\u003cli\u003eOffers the most up-to-date information on point defects, based on physical microscopic models.\u003c\/li\u003e\n\u003c\/ul\u003e\u003cp\u003e\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2020-04-27\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9783030374990\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-3-030-37500-3\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 729\u003c\/p\u003e ","brand":"Springer International Publishing","offers":[{"title":"Default Title","offer_id":47528489779340,"sku":"9783030374990","price":125.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9783030374990.jpg?v=1776042150","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9783030374990","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}