{"product_id":"9781493955299","title":"Bias Temperature Instability for Devices and Circuits","description":"\u003ch1\u003eBias Temperature Instability for Devices and Circuits\u003c\/h1\u003e \u003ch2\u003eGrasser, Tibor\u003c\/h2\u003e \u003cp\u003eThis book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2016-10-01\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9781493955299\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4614-7909-3\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 810\u003c\/p\u003e ","brand":"Springer New York","offers":[{"title":"Default Title","offer_id":47520202522764,"sku":"9781493955299","price":107.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9781493955299.jpg?v=1775968700","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9781493955299","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}