Bias Temperature Instability for Devices and Circuits

Grasser, Tibor

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Details

Published by: Springer

Publication Date: 2016-10-01

Format: Paperback

ISBN-13: 9781493955299

DOI: 10.1007/978-1-4614-7909-3

Dimensions: 235cm x155cm

Pages: 810