CMOS Test and Evaluation: A Physical Perspective

Bhushan, Manjul; Ketchen, Mark B.

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Details

Published by: Springer

Publication Date: 2016-09-10

Format: Paperback

ISBN-13: 9781493947027

DOI: 10.1007/978-1-4939-1349-7

Dimensions: 235cm x155cm

Pages: 424