A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work.

Dr. Kaufmann is Associate Director of the Strategic Planning Group Illinois, and Associate Chief Scientist for Laboratory Directed Research and Development; Physicist, with the Materials Science Division at the Argonne National Laboratory, Argonne, IL.?He has been with Argonne since 1989 and has served in several positions.
Dr. Kaufmann holds a B.Sc. in Physics from the Rensselaer Polytechnic Institute, Troy, New York and a Ph.D. from California Institute of Technology, Pasadena, California, where he was also a Post-Doctoral Research Assistant. Prior to joining Argonne, Dr. Kaufmann was with Lawrence Livermore National Laboratory, Livermore, California in the Chemistry and Materials Science Department as a Division Leader of Materials, and with the Bell Telephone Laboratories, Murray Hill, New Jersey as a member of the Radiation Physics Research Department.
Dr. Kaufmann is a member of the Materials Research Society in which he held several positions including President (1985). He is also a member of The Minerals, Metals and Materials Society, the American Association for the Advancement of Science, as well as a Fellow of the American Physical Society.
He has served as Program Chair/Organizer of several conferences and as editor of various publications. Dr. Kaufmann has published approximately 100 technical papers in refereed journals and books. He is Editor-in-Chief of the reference work Characterization of Materials (John Wiley & Sons, NY 2003).