{"product_id":"9780792396734","title":"Frontiers in Electronic Testing","description":"\u003ch1\u003eFrontiers in Electronic Testing\u003c\/h1\u003e \u003ch2\u003eXinghao Chen; Bushnell, Michael L.\u003c\/h2\u003e \u003cp\u003eBranch-and-bound search has been known for a long time and has  been widely used in solving a variety of problems in computer-aided  design (CAD) and many important optimization problems. \u003cbr\u003e  In many applications, the classic branch-and-bound search methods  perform duplications of computations, or rely on the search decision  trees which keep track of the branch-and-bound search processes. In  CAD and many other technical fields, the computational cost of  constructing branch-and-bound search decision trees in solving large  scale problems is prohibitive and duplications of computations are  intolerable. Efficient branch-and-bound methods are needed to deal  with today's computational challenges. Efficient branch-and-bound  methods must not duplicate computations. \u003cbr\u003e  \u003cem\u003eEfficient Branch and Bound Search with Application to  Computer-Aided\u003c\/em\u003e \u003cem\u003eDesign\u003c\/em\u003e describes an efficient branch-and-bound  method for logic justification, which is fundamental to \u003cem\u003eautomatic  test pattern\u003c\/em\u003e \u003cem\u003egeneration\u003c\/em\u003e (ATPG), redundancy identification,  logic synthesis, minimization, verification, and other problems in  CAD. The method is called \u003cem\u003ejustification equivalence\u003c\/em\u003e, based on  the observation that justification processes may share identical  subsequent search decision sequences. With justification equivalence,  duplication of computations is avoided in the dynamic branch-and-bound  search process without using search decision trees. \u003cbr\u003e  \u003cem\u003eEfficient Branch and Bound Search with Application to  Computer-Aided\u003c\/em\u003e \u003cem\u003eDesign\u003c\/em\u003e consists of two parts. The first part,  containing the first three chapters, provides the theoretical work.  The second part deals with applications, particularly ATPG for  sequential circuits. \u003cbr\u003e  This book is particularly useful to readers who are interested in the  design and test of digital circuits.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 1995-12-31\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9780792396734\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4613-1329-8\u003c\/p\u003e \u003cp\u003eDimensions: 234cm x156cm\u003c\/p\u003e \u003cp\u003ePages: 146\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":46312094498956,"sku":"9780792396734","price":98.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9780792396734.jpg?v=1771518140","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9780792396734","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}