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Unified Methods for VLSI Simulation and Test Generation
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The Springer International Series in Engineering and Computer Science
Unified Methods for VLSI Simulation and Test Generation
Kwang-Ting (Tim) Cheng | Vishwani D. Agrawal
Technology & Engineering / Electrical
| Publication Date: | 30 June 1989 |
| Publisher: | Springer US |
| Imprint: | Springer |
| ISBN-13: | 9780792390251 |
| Format: | Hardback |
| Page Count: | 148 |