{"product_id":"9780792382638","title":"Frontiers in Electronic Testing","description":"\u003ch1\u003eFrontiers in Electronic Testing\u003c\/h1\u003e \u003ch2\u003eSheppard, John W.; Simpson, William R.\u003c\/h2\u003e \u003cp\u003e\"System level testing is becoming increasingly important.  It is driven by the incessant march of complexity ... which is forcing  us to renew our thinking on the processes and procedures that we apply  to test and diagnosis of systems. In fact, the complexity defines the  system itself which, for our purposes, is ¿any aggregation of  related elements that together form an entity of sufficient complexity  for which it is impractical to treat all of the elements at the lowest  level of detail . System approaches embody the partitioning of  problems into smaller inter-related subsystems that will be solved  together. Thus, words like hierarchical, dependence, inference, model,  and partitioning are frequent throughout this text. Each of the  authors deals with the complexity issue in a similar fashion, but the  real value in a collected work such as this is in the subtle  differences that may lead to synthesized approaches that allow even  more progress. \u003cbr\u003e  The works included in this volume are an outgrowth of the 2nd  International Workshop on System Test and Diagnosis held in  Alexandria, Virginia in April 1998. The first such workshop was held  in Freiburg, Germany, six years earlier. In the current workshop  nearly 50 experts from around the world struggled over issues  concerning the subject... In this volume, a select group of workshop  participants was invited to provide a chapter that expanded their  workshop presentations and incorporated their workshop interactions...  While we have attempted to present the work as one volume and  requested some revision to the work, the content of the individual  chapters was not edited significantly. Consequently, you will see  different approaches to solving the same problems and occasional  disagreement between authors as to definitions or the importance of  factors. \u003cbr\u003e  ... The works collected in this volume represent the state-of-the-art  in system test and diagnosis, and the authors are at the leading edge  ofthat science...”. \u003cbr\u003e  From the Preface\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 1998-09-30\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9780792382638\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4615-5545-2\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 232\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":46312094531724,"sku":"9780792382638","price":152.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9780792382638.jpg?v=1771518142","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9780792382638","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}