{"product_id":"9780470404614","title":"Image Processing and Pattern Recognition Fundamentals and Techniques","description":"\u003ch1\u003eImage Processing and Pattern Recognition\u003c\/h1\u003e\u003ch2\u003eFundamentals and Techniques\u003c\/h2\u003e\u003ch3\u003eFrank Y. Shih\u003c\/h3\u003e\u003cdiv\u003e\u003cb\u003eTechnology \u0026amp; Engineering \/ Electronics \/ Digital\u003c\/b\u003e\u003c\/div\u003e\u003cbr\u003e\u003cdiv\u003e\n\u003cb\u003eA comprehensive guide to the essential principles of image processing and pattern recognition\u003c\/b\u003e  \u003cp\u003eTechniques and applications in the areas of image processing and pattern recognition are growing at an unprecedented rate. Containing the latest state-of-the-art developments in the field, \u003ci\u003eImage Processing and Pattern Recognition\u003c\/i\u003e presents clear explanations of the fundamentals as well as the most recent applications. It explains the essential principles so readers will not only be able to easily implement the algorithms and techniques, but also lead themselves to discover new problems and applications.\u003c\/p\u003e \u003cp\u003eUnlike other books on the subject, this volume presents numerous fundamental and advanced image processing algorithms and pattern recognition techniques to illustrate the framework. Scores of graphs and examples, technical assistance, and practical tools illustrate the basic principles and help simplify the problems, allowing students as well as professionals to easily grasp even complicated theories. It also features unique coverage of the most interesting developments and updated techniques, such as image watermarking, digital steganography, document processing and classification, solar image processing and event classification, 3-D Euclidean distance transformation, shortest path planning, soft morphology, recursive morphology, regulated morphology, and sweep morphology. Additional topics include enhancement and segmentation techniques, active learning, feature extraction, neural networks, and fuzzy logic.\u003c\/p\u003e \u003cp\u003eFeaturing supplemental materials for instructors and students, \u003ci\u003eImage Processing and Pattern Recognition\u003c\/i\u003e is designed for undergraduate seniors and graduate students, engineering and scientific researchers, and professionals who work in signal processing, image processing, pattern recognition, information security, document processing, multimedia systems, and solar physics.\u003c\/p\u003e\n\u003c\/div\u003e\u003cdiv\u003e \u003cb\u003eFrank Y. Shih\u003c\/b\u003e is a professor jointly appointed in the Department of Computer Science, the Department of Electrical and Computer Engineering, and the Department of Biomedical Engineering at New Jersey Institute of Technology, Newark, New Jersey. He is also Director of Computer Vision Laboratory. He is an internationally renowned scholar and serves as the Editor-in-Chief for the \u003ci\u003eInternational Journal of Multimedia Intelligence and Security (IJMIS)\u003c\/i\u003e. Dr. Shih is currently on the editorial boards of \u003ci\u003ePattern Recognition, Pattern Recognition Letters\u003c\/i\u003e, the \u003ci\u003eInternational Journal of Pattern Recognition and Artificial Intelligence\u003c\/i\u003e, \u003ci\u003eJournal of Information Hiding and Multimedia Signal Processing\u003c\/i\u003e, \u003ci\u003eRecent Patents on Engineering, Recent Patents on Computer Science\u003c\/i\u003e, \u003ci\u003eThe Open Nanoscience Journal\u003c\/i\u003e, the \u003ci\u003eInternational Journal of Internet Protocol Technology\u003c\/i\u003e, and the \u003ci\u003eJournal of Internet Technology\u003c\/i\u003e. The recipient of several awards for distinguished research, Dr. Shih has also made significant contributions to information hiding, focusing on the security and robustness of digital steganography and watermarking.\u003c\/div\u003e\u003cbr\u003e\u003ctable\u003e\n\u003ctr\u003e\n\u003ctd\u003ePublication Date: \u003c\/td\u003e\n\u003ctd\u003e03 May 2010\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003ePublisher: \u003c\/td\u003e\n\u003ctd\u003eWiley\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImprint: \u003c\/td\u003e\n\u003ctd\u003eWiley-IEEE Press\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eISBN-13: \u003c\/td\u003e\n\u003ctd\u003e9780470404614\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eFormat: \u003c\/td\u003e\n\u003ctd\u003eHardback\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003ePage Count: \u003c\/td\u003e\n\u003ctd\u003e560\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWeight (oz): \u003c\/td\u003e\n\u003ctd\u003e32.64\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e","brand":"Wiley","offers":[{"title":"Default Title","offer_id":44311316234380,"sku":"9780470404614","price":166.46,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9780470404614_4d4e761a-fad4-4bcf-83a4-1b65a42c3642.jpg?v=1780153236","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9780470404614","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}