This book presents an in-depth treatment of various power reduction and speed enhancement techniques based on multiple supply and threshold voltages. A detailed discussion of the sources of power consumption in CMOS circuits will be provided whilst focusing primarily on identifying the mechanisms by which sub-threshold and gate oxide leakage currents are generated. The authors present a comprehensive review of state-of-the-art dynamic, static supply and threshold voltage scaling techniques and discuss the pros and cons of supply and threshold voltage scaling techniques.

DR VOLKAN KURSUN, Department of Electrical & Computer Engineering, University of Rochester, Rochester, New York 14627-0231, USA.

PROFESSOR DR EBY G. FRIEDMAN, Department of Electrical & Computer Engineering , University of Rochester , Rochester, New York 14627-0231, USA.