{"product_id":"9780306440038","title":"Advances in X-Ray Analysis","description":"\u003ch1\u003eAdvances in X-Ray Analysis\u003c\/h1\u003e \u003ch2\u003eBarrett, C.S.; Amara, M.; Huang, Ting C.; Bernard, Nick; Knorr, Dietrich\u003c\/h2\u003e \u003cp\u003eThe 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The \"Denver Conference\" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop­ ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: \"Surface and Near-Surface X-Ray Spectroscopy. \" The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed \"Recent Developments and Results in Total-Reflection X-Ray Fluorescence. \" Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on \"Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. \" He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 1991-06-30\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9780306440038\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4615-3744-1\u003c\/p\u003e \u003cp\u003eDimensions: cm xcm\u003c\/p\u003e \u003cp\u003ePages: 743\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":46312679899276,"sku":"9780306440038","price":89.1,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9780306440038.jpg?v=1771528754","url":"https:\/\/fh90cf-fv.myshopify.com\/products\/9780306440038","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}